Dr. Craig Schwartz

My primary research interest lies in studying materials by using X-ray-based methods. This includes well-established techniques such as X-ray Absorption Spectroscopy (XAS), X-ray Emission Spectroscopy (XES), and X-ray Photoelectron Spectroscopy (XPS). These techniques collectively allow for the elemental-specific characterization of the occupied and unoccupied electronic structure of a given system.

These measurements are traditionally made at large-scale facilities such as the Advanced Photon Source (APS) in Illinois and the Advanced Light Source (ALS) in California. However, there have been tremendous developments in X-ray pulse generation recently, which has enabled ultrafast (10^-15 second) studies of materials. In particular, these sources enable one to understand the dynamics of a material. These studies can be performed at large international facilities such as SACLA in Japan, EuXFEL in Germany, and FERMI in Italy.

Expertise

Spectroscopy; X-ray sources

Education

Postdoctoral Researcher, SLAC National Laboratory, Menlo Park, CA

Ph.D., Physical Chemistry, University of California, Berkeley, CA

B.A., Chemistry, Northwestern University, Evanston, IL